Category: Microscopy; Materials characterization; Cleanrooms
Manufacturer; Model: Tescan; Lyra
Short description:
Category: Microscopy
Manufacturer; Model: Phenom-World; Phenom Pro
Short description: The Phenom Pro Desktop SEM is used to relieve the burden of routine analysis for common samples for floor-model SEM instruments. Instrument configuration and the sample loading mechanism ensure quick imaging with minimal time spent tuning between experiments.
Category: Microscopy; Materials characterization; Cleanrooms
Manufacturer; Model: Fei;Tecnai GF20
Short description: TEM Fei Tecnai G2 F20 is an electron microscope with the highest resolution in Latvia. Measurements with TEM provides high resolution information about the composition, structure and morphology of the sample.
Category: Spectroscopy methods and lasers; Materials characterization; Microscopy
Manufacturer; Model: Bruker; Vertex 80v
Short description: Infrared Fourier Vacuum Spectrometer Bruker VERTEX 80v offers FTIR analysis of the organic and inorganic materials, crystals, semiconductors, chemistry, biology, etc. Tool is equiped with Hyperion 2000 Infrared Microscope.
Category: Microscopy; Cleanrooms
Manufacturer; Model: Nikon; Various
Short description:
Category: Materials characterization; Cleanrooms; Microscopy
Manufacturer; Model: Various
Short description: Profiler is applicable to determination of transparent films/photoresist and other films thickness, thin- and thick-film measurements, toughness studies, surface quality and defect review.
Category: Spectroscopy methods and lasers; Microscopy; Materials characterization
Manufacturer; Model: Spectroscopy & imaging GmbH; TriVista CRS Confocal Raman Microscope (TR777)
Short description: Measurements from Raman spectrometer offer identification and qualitative analysis of chemical structure of organic and inorganic materials.
Category: Materials characterization; Materials synthesis and treatment; Microscopy
Manufacturer; Model: Form Factor - MPS 1500
Short description: