SCANNING ELECTRON MICROSCOPE ZEISS CROSSBEAM 550
Dr. Fabian Perez (ZEISS GmbH, Germany) speaks at the scientific workshop of ISSP UL Doctoral School “Functional Materials and Nanotechnologies”.
Presentation moderator: ZEISS GmbH representative Dr. Fabian Perez (Germany)
Presentation topics:
- Preparing the TEM lamellae
- Zeiss FIB column technology
- Advanced TEM lamellae preparation technologies
- Gemini 2 SEM column
During the presentation, participants are welcome to ask questions to the experts of FIB technology, as well as to get acquainted with the latest technologies offered by one of the leading manufacturers in the world.